Skip to product information
Semiconductor Interfaces: Formation and Properties: Proceedings of the Workkshop, Les Houches, France February 24-March 6, 1987 (Softcover Reprint of

Semiconductor Interfaces: Formation and Properties

$109.99
Shipping calculated at checkout.
  • Authorized Dealer
  • Ships within 1 business day
  • Free 30-Day Returns
  • Secure Checkout via Shopify Payments
Details

"Semiconductor Interfaces: Formation and Properties" by Guy LeLay, Jacques Derrien, Nino Boccara is a physics book focused on Devices & Sensors. Best for students, educators, and scientifically curious readers.

The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the elaboration of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure. (iii) Specific physical properties of the interfaces and their prospective applications in devices. We wish to thank warmly all the lecturers and participants, as well as the organizing committee, who made this Winter School a success.

Materials + Care

We prioritize quality in selecting the materials for our items, choosing premium fabrics and finishings that ensure durability, comfort, and timeless appeal.

Shipping + Returns

We strive to process and ship all orders in a timely manner, working diligently to ensure that your items are on their way to you as soon as possible.

Best For: Researchers and professionals in microelectronics and materials science
Focus: Formation and properties of semiconductor interfaces with emphasis on thin films and multilayers
Covers: Advances in thin film materials, characterization techniques at atomic scale, and interfacial properties
Why It Matters: Understanding semiconductor interfaces is essential for miniaturization and development of new optoelectronic devices

"Semiconductor Interfaces: Formation and Properties" by Guy LeLay, Jacques Derrien, Nino Boccara is a physics book focused on Devices & Sensors. Best for students, educators, and scientifically curious readers.

Topic: Devices & Sensors

Author: Guy LeLay, Jacques Derrien, Nino Boccara

Who this is for:

  • Physics students
  • Science-minded readers
  • Readers building technical understanding

Why this book matters: It provides structured coverage of physics concepts in a way that supports deeper understanding and continued study.

The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the elaboration of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure. (iii) Specific physical properties of the interfaces and their prospective applications in devices. We wish to thank warmly all the lecturers and participants, as well as the organizing committee, who made this Winter School a success.

AuthorGuy LeLay, Jacques Derrien, Nino Boccara
PublisherSpringer
Published2011-12-06
ISBN-139783642729690
BindingPaperback
Pages389
LanguageEnglish
SubjectsScience
TopicDevices & Sensors
SeriesSpringer Proceedings in Physics

Format: Paperback

Length: 389 pages

Language: English

Shop by collection

You might also like...