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Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices

Scanning Nonlinear Dielectric Microscopy

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"Scanning Nonlinear Dielectric Microscopy" by Yasuo Cho is a physics book focused on Devices & Sensors. Best for students, educators, and scientifically curious readers.

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.

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Best For: Researchers and engineers working with ferroelectric, dielectric, and semiconductor materials
Focus: Techniques and applications of scanning nonlinear dielectric microscopy
Covers: Methods for characterizing materials and devices using nonlinear dielectric microscopy, including atomic scale measurement of ferroelectric materials
Why It Matters: Provides detailed methodology from the inventor to support precise material characterization essential for advancing electronic and materials science

"Scanning Nonlinear Dielectric Microscopy" by Yasuo Cho is a physics book focused on Devices & Sensors. Best for students, educators, and scientifically curious readers.

Topic: Devices & Sensors

Author: Yasuo Cho

Who this is for:

  • Physics students
  • Science-minded readers
  • Readers building technical understanding

Why this book matters: It provides structured coverage of physics concepts in a way that supports deeper understanding and continued study.

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.

AuthorYasuo Cho
PublisherWoodhead Publishing
Published2020-05-21
ISBN-139780128172469
BindingPaperback
Pages256
LanguageEnglish
SubjectsTechnology & Engineering
TopicDevices & Sensors
SeriesWoodhead Publishing Electronic and Optical Materials

Format: Paperback

Length: 256 pages

Language: English

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