Skip to product information
Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983

Microscopy of Semiconducting Materials

$300.00
Shipping calculated at checkout.
  • Authorized Dealer
  • Ships within 1 business day
  • Free 30-Day Returns
  • Secure Checkout via Shopify Payments
Details

"Microscopy of Semiconducting Materials" by Cullis, A G is a physics book focused on Devices & Sensors. Best for students, educators, and scientifically curious readers.

This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21-23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.

Materials + Care

We prioritize quality in selecting the materials for our items, choosing premium fabrics and finishings that ensure durability, comfort, and timeless appeal.

Shipping + Returns

We strive to process and ship all orders in a timely manner, working diligently to ensure that your items are on their way to you as soon as possible.

"Microscopy of Semiconducting Materials" by Cullis, A G is a physics book focused on Devices & Sensors. Best for students, educators, and scientifically curious readers.

Topic: Devices & Sensors

Author: Cullis, A G

Who this is for:

  • Physics students
  • Science-minded readers
  • Readers building technical understanding

Why this book matters: It provides structured coverage of physics concepts in a way that supports deeper understanding and continued study.

This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21-23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.

AuthorCullis, A G
PublisherCRC Press
Published1983
ISBN-139780854981588
BindingHardcover
Pages542
LanguageEnglish
SubjectsElectron microscopy
TopicDevices & Sensors
SeriesInstitute of Physics Conference

Format: Hardcover

Length: 542 pages

Language: English

Shop by collection

You might also like...