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Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons (2004)

Infrared Ellipsometry on Semiconductor Layer Structures

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"Infrared Ellipsometry on Semiconductor Layer Structures" by Mathias Schubert is a physics book focused on Light & Optics. Best for students, educators, and scientifically curious readers.

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.

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Best For: Researchers and students in physics and materials science focusing on semiconductor layer structures.
Focus: Infrared ellipsometry techniques applied to phonons, plasmons, and polaritons in semiconductors.
Covers: Basic concepts of phonons, plasmons, polaritons, and the infrared dielectric function in layered semiconductor structures; analysis of strain, composition, and atomic order in multinary alloy layers.
Why It Matters: Provides foundational understanding and practical methods for characterizing semiconductor layers, important for advancing optical spectroscopy and materials engineering.

"Infrared Ellipsometry on Semiconductor Layer Structures" by Mathias Schubert is a physics book focused on Light & Optics. Best for students, educators, and scientifically curious readers.

Topic: Light & Optics

Author: Mathias Schubert

Who this is for:

  • Physics students
  • Science-minded readers
  • Readers building technical understanding

Why this book matters: It provides structured coverage of physics concepts in a way that supports deeper understanding and continued study.

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.

AuthorMathias Schubert
PublisherSpringer
Published2010-11-23
ISBN-139783642062285
BindingPaperback
LanguageEnglish
SubjectsScience
TopicLight & Optics
SeriesSpringer Tracts in Modern Physics

Format: Paperback

Language: English

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