Bias Temperature Instability for Devices and Circuits
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"Bias Temperature Instability for Devices and Circuits" by Tibor Grasser is a physics book focused on Devices & Sensors. Best for students, educators, and scientifically curious readers.
This book provides a reference to one of the more challenging reliability issues plaguing modern semiconductor technologies. It introduces a new defect model for metastable defect states, nonradiative multiphonon theory and stochastic behavior.
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"Bias Temperature Instability for Devices and Circuits" by Tibor Grasser is a physics book focused on Devices & Sensors. Best for students, educators, and scientifically curious readers.
Topic: Devices & Sensors
Author: Tibor Grasser
Who this is for:
- Physics students
- Science-minded readers
- Readers building technical understanding
Why this book matters: It provides structured coverage of physics concepts in a way that supports deeper understanding and continued study.
This book provides a reference to one of the more challenging reliability issues plaguing modern semiconductor technologies. It introduces a new defect model for metastable defect states, nonradiative multiphonon theory and stochastic behavior.
| Author | Tibor Grasser |
| Publisher | Springer |
| Published | 2013-10-23 |
| ISBN-13 | 9781461479086 |
| Binding | Hardcover |
| Language | English |
| Subjects | Technology & Engineering |
| Topic | Devices & Sensors |
Format: Hardcover
Language: English
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