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Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications (2014)

Theoretical Concepts of X-Ray Nanoscale Analysis

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"Theoretical Concepts of X-Ray Nanoscale Analysis" by Andrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov is a mathematics book and learning resource focused on Cosmology. Best for teachers, students, and readers looking for stronger mathematical understanding.

This book surveys concepts of X-ray materials analysis, including X-ray scattering and interaction between X-rays and matter, plus techniques including high-resolution X-ray diffraction, reflectivity, grazing-incidence small-angle X-ray scattering and more.

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Best For: Researchers and students in physics and materials science focusing on nanoscale analysis techniques.
Focus: Theoretical principles and practical applications of X-ray methods for analyzing materials at the nanoscale.
Covers: X-ray scattering, interaction of X-rays with matter, high-resolution X-ray diffraction, reflectivity, grazing-incidence small-angle X-ray scattering, and related techniques.
Why It Matters: Provides a detailed understanding of advanced X-ray analysis methods essential for nanoscale material characterization in physics and engineering.

"Theoretical Concepts of X-Ray Nanoscale Analysis" by Andrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov is a mathematics book and learning resource focused on Cosmology. Best for teachers, students, and readers looking for stronger mathematical understanding.

Topic: Cosmology

Author: Andrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov

Who this is for:

  • Teachers and classroom instructors
  • Students building subject mastery
  • Readers looking for practical learning support

Why this book matters: It stands out as a practical math resource that helps explain concepts, strengthen problem-solving, and support classroom or independent learning.

This book surveys concepts of X-ray materials analysis, including X-ray scattering and interaction between X-rays and matter, plus techniques including high-resolution X-ray diffraction, reflectivity, grazing-incidence small-angle X-ray scattering and more.

AuthorAndrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov
PublisherSpringer
Published2013-09-18
ISBN-139783642381768
BindingHardcover
LanguageEnglish
SubjectsTechnology & Engineering
TopicCosmology
SeriesSpringer Materials Science

Format: Hardcover

Language: English

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