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Spectroscopic Ellipsometry: Principles and Applications

Spectroscopic Ellipsometry

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"Spectroscopic Ellipsometry" by Hiroyuki Fujiwara is a book focused on Light & Optics. Best for readers interested in this subject.

Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.

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Best For: Students and professionals in physics and materials science focusing on thin film analysis.
Focus: Fundamental principles and data analysis techniques of spectroscopic ellipsometry.
Covers: Overview of SE technologies, data analysis methods, physical principles, and materials used in various fields.
Why It Matters: Provides foundational knowledge and practical approaches for characterizing thin films and semiconductor structures using spectroscopic ellipsometry.

"Spectroscopic Ellipsometry" by Hiroyuki Fujiwara is a book focused on Light & Optics. Best for readers interested in this subject.

Topic: Light & Optics

Author: Hiroyuki Fujiwara

Who this is for:

  • Students
  • Educators
  • Interested readers

Why this book matters: It offers useful subject matter and structured coverage for readers looking to explore the topic in more depth.

Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.

AuthorHiroyuki Fujiwara
PublisherWiley
Published2007-03-12
ISBN-139780470016084
BindingHardcover
Pages392
LanguageEnglish
SubjectsTechnology & Engineering
TopicLight & Optics

Format: Hardcover

Length: 392 pages

Language: English

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