Microscopy of Semiconducting Materials
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"Microscopy of Semiconducting Materials" by A.G. Cullis, John L. Hutchison is a physics book focused on Devices & Sensors. Best for students, educators, and scientifically curious readers.
The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.
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"Microscopy of Semiconducting Materials" by A.G. Cullis, John L. Hutchison is a physics book focused on Devices & Sensors. Best for students, educators, and scientifically curious readers.
Topic: Devices & Sensors
Author: A.G. Cullis, John L. Hutchison
Who this is for:
- Physics students
- Science-minded readers
- Readers building technical understanding
Why this book matters: It provides structured coverage of physics concepts in a way that supports deeper understanding and continued study.
The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.
| Author | A.G. Cullis, John L. Hutchison |
| Publisher | Springer |
| Published | 2010-10-19 |
| ISBN-13 | 9783642068706 |
| Binding | Paperback |
| Pages | 540 |
| Language | English |
| Subjects | Technology & Engineering |
| Topic | Devices & Sensors |
| Series | Springer Proceedings in Physics |
Format: Paperback
Length: 540 pages
Language: English
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