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Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Microscopy of Semiconducting Materials

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"Microscopy of Semiconducting Materials" by A.G. Cullis, John L. Hutchison is a physics book focused on Devices & Sensors. Best for students, educators, and scientifically curious readers.

The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.

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Best For: Researchers and professionals in semiconductor materials and microscopy techniques
Focus: Advances in structural and electronic property analysis of semiconducting materials using electron microscopy
Covers: Transmission and scanning electron microscopy, scanning probe microscopy, X-ray topography, and diffraction methods
Why It Matters: Provides updated insights into microcharacterisation techniques critical for understanding and developing semiconducting materials

"Microscopy of Semiconducting Materials" by A.G. Cullis, John L. Hutchison is a physics book focused on Devices & Sensors. Best for students, educators, and scientifically curious readers.

Topic: Devices & Sensors

Author: A.G. Cullis, John L. Hutchison

Who this is for:

  • Physics students
  • Science-minded readers
  • Readers building technical understanding

Why this book matters: It provides structured coverage of physics concepts in a way that supports deeper understanding and continued study.

The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.

AuthorA.G. Cullis, John L. Hutchison
PublisherSpringer
Published2010-10-19
ISBN-139783642068706
BindingPaperback
Pages540
LanguageEnglish
SubjectsTechnology & Engineering
TopicDevices & Sensors
SeriesSpringer Proceedings in Physics

Format: Paperback

Length: 540 pages

Language: English

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