Microscopy of Semiconducting Materials
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"Microscopy of Semiconducting Materials" by A.G Cullis, R Beanland is a physics book focused on Devices & Sensors. Best for students, educators, and scientifically curious readers.
Microscopy of Semiconducting Materials provides an overview of advances in semiconductor studies using microscopy. This authoritative reference explores the use of transmission and scanning electron microscopy, ultrafine electron probes, and EELS to investigate semiconducting structures. It also covers specimen preparation using focused ion beam milling and advances in microscopy techniques using different types of scanning probes, such as AFM, STM, and SCM. In addition, the volume discusses a range of materials, from finished devices to partly processed materials and structures, including nanoscale wires and dots.
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"Microscopy of Semiconducting Materials" by A.G Cullis, R Beanland is a physics book focused on Devices & Sensors. Best for students, educators, and scientifically curious readers.
Topic: Devices & Sensors
Author: A.G Cullis, R Beanland
Who this is for:
- Physics students
- Science-minded readers
- Readers building technical understanding
Why this book matters: It provides structured coverage of physics concepts in a way that supports deeper understanding and continued study.
Microscopy of Semiconducting Materials provides an overview of advances in semiconductor studies using microscopy. This authoritative reference explores the use of transmission and scanning electron microscopy, ultrafine electron probes, and EELS to investigate semiconducting structures. It also covers specimen preparation using focused ion beam milling and advances in microscopy techniques using different types of scanning probes, such as AFM, STM, and SCM. In addition, the volume discusses a range of materials, from finished devices to partly processed materials and structures, including nanoscale wires and dots.
| Author | A.G Cullis, R Beanland |
| Publisher | CRC Press |
| Published | 2000-01-01 |
| ISBN-13 | 9780750306508 |
| Binding | Hardcover |
| Pages | 782 |
| Language | English |
| Subjects | Technology & Engineering |
| Topic | Devices & Sensors |
| Series | Institute of Physics Conference |
Format: Hardcover
Length: 782 pages
Language: English
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