Interfaces in High-Tc Superconducting Systems
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"Interfaces in High-Tc Superconducting Systems" by Subhash L. Shinde, David Rudman is a book focused on Devices & Sensors. Best for readers interested in this subject.
Because the new high-temperature superconductors cannot be grown as large single crystals, interfaces and junctions play an important role in their properties. The chapters in this book, each by leading researchers in the field, examine the state of our understanding of such interfaces. Chapters cover such topics as studies of YCBO films by transmission-electron, scanning-tunneling, and atomic-force microscopy; microstructure, interfacial interactions, and twin boundary structures in YCBO films; grain-boundary Josephson junctions; and overlayer formation.
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"Interfaces in High-Tc Superconducting Systems" by Subhash L. Shinde, David Rudman is a book focused on Devices & Sensors. Best for readers interested in this subject.
Topic: Devices & Sensors
Author: Subhash L. Shinde, David Rudman
Who this is for:
- Students
- Educators
- Interested readers
Why this book matters: It offers useful subject matter and structured coverage for readers looking to explore the topic in more depth.
Because the new high-temperature superconductors cannot be grown as large single crystals, interfaces and junctions play an important role in their properties. The chapters in this book, each by leading researchers in the field, examine the state of our understanding of such interfaces. Chapters cover such topics as studies of YCBO films by transmission-electron, scanning-tunneling, and atomic-force microscopy; microstructure, interfacial interactions, and twin boundary structures in YCBO films; grain-boundary Josephson junctions; and overlayer formation.
| Author | Subhash L. Shinde, David Rudman |
| Publisher | Springer |
| Published | 2013-05-31 |
| ISBN-13 | 9781461275930 |
| Binding | Paperback |
| Pages | 240 |
| Language | English |
| Subjects | Technology & Engineering |
| Topic | Devices & Sensors |
Format: Paperback
Length: 240 pages
Language: English
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