Fringe 2005
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"Fringe 2005" by Wolfgang Osten is a book focused on Light & Optics. Best for readers interested in this subject.
The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moiré and Grid Techniques for Stress Analysis, Nondestructive Testing, Shape Measurement, Fault Detection, Quality Control and related fields.
Topics of particular interest are:
Advanced Computer Aided Measurement Techniques;
Resolution Enhanced Technologies in Optical Metrology;
New approaches in Wide Scale 4D Optical Metrology;
Sophisticated Sensors Systems and their applications for the solution of challenging measurement problems.
Special emphasis is put on modern Measurement Strategies taking into account the active combination of Physical Modeling, Computer Aided Simulation and Experimental Data Acquisition. Further attention is directed to new approaches for the Extension of Existing Resolution Limits that open the gates to Wide Scale Metrology ranging from nano to macro by using Advanced Optical Sensor Systems.
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"Fringe 2005" by Wolfgang Osten is a book focused on Light & Optics. Best for readers interested in this subject.
Topic: Light & Optics
Author: Wolfgang Osten
Who this is for:
- Students
- Educators
- Interested readers
Why this book matters: It offers useful subject matter and structured coverage for readers looking to explore the topic in more depth.
The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moiré and Grid Techniques for Stress Analysis, Nondestructive Testing, Shape Measurement, Fault Detection, Quality Control and related fields.
Topics of particular interest are:
Advanced Computer Aided Measurement Techniques;
Resolution Enhanced Technologies in Optical Metrology;
New approaches in Wide Scale 4D Optical Metrology;
Sophisticated Sensors Systems and their applications for the solution of challenging measurement problems.
Special emphasis is put on modern Measurement Strategies taking into account the active combination of Physical Modeling, Computer Aided Simulation and Experimental Data Acquisition. Further attention is directed to new approaches for the Extension of Existing Resolution Limits that open the gates to Wide Scale Metrology ranging from nano to macro by using Advanced Optical Sensor Systems.
| Author | Wolfgang Osten |
| Publisher | Springer |
| Published | 2010-02-12 |
| ISBN-13 | 9783642065330 |
| Binding | Paperback |
| Language | English |
| Subjects | Technology & Engineering |
| Topic | Light & Optics |
Format: Paperback
Language: English
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