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CMOS Test and Evaluation: A Physical Perspective (Softcover Reprint of the Original 1st 2015)

CMOS Test and Evaluation

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"CMOS Test and Evaluation" by Manjul Bhushan, Mark B. Ketchen is a physics book focused on Devices & Sensors. Best for students, educators, and scientifically curious readers.

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

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Best For: Engineers and researchers working with CMOS technology and semiconductor testing
Focus: Test and data analysis methods for CMOS products from a physical and statistical perspective
Covers: Circuit sensitivities, silicon process variability, embedded test structures, product yield, reliability, and data visualization techniques
Why It Matters: Provides an integrated approach to understanding and improving CMOS product testing and reliability based on physical device characteristics and statistical analysis

"CMOS Test and Evaluation" by Manjul Bhushan, Mark B. Ketchen is a physics book focused on Devices & Sensors. Best for students, educators, and scientifically curious readers.

Topic: Devices & Sensors

Author: Manjul Bhushan, Mark B. Ketchen

Who this is for:

  • Physics students
  • Science-minded readers
  • Readers building technical understanding

Why this book matters: It provides structured coverage of physics concepts in a way that supports deeper understanding and continued study.

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

AuthorManjul Bhushan, Mark B. Ketchen
PublisherSpringer
Published2016-09-10
ISBN-139781493947027
BindingPaperback
LanguageEnglish
SubjectsTechnology & Engineering
TopicDevices & Sensors

Format: Paperback

Language: English

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