Atomic Scale Characterization and First-Principles Studies of Si3n4 Interfaces
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"Atomic Scale Characterization and First-Principles Studies of Si3n4 Interfaces" by Walkosz, Weronika is a astronomy book and space science reference focused on Cosmology. Best for students, researchers, and serious astronomy enthusiasts.
This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.
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"Atomic Scale Characterization and First-Principles Studies of Si3n4 Interfaces" by Walkosz, Weronika is a astronomy book and space science reference focused on Cosmology. Best for students, researchers, and serious astronomy enthusiasts.
Topic: Cosmology
Author: Walkosz, Weronika
Who this is for:
- Astronomy students
- Researchers and advanced hobbyists
- Readers exploring space science topics
Why this book matters: It matters because it helps readers build a stronger understanding of astronomy concepts, observations, and scientific ideas related to space.
This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.
| Author | Walkosz, Weronika |
| Publisher | Springer |
| Published | 2011-04-19 |
| ISBN-13 | 9781441978165 |
| Binding | Hardcover |
| Subjects | Technology & Engineering | Materials Science | Ceramics ; Science | Chemistry | Physical & Theoretical ; Science | Physics | Atomic & Molecular ; Science | Spectroscopy & Spectrum Analysis ; Science | Biotechnology ; Technology & Engineering | Nanotechnol |
| Topic | Cosmology |
| Series | Springer Theses |
There are currently no manuals attached to this product
Format: Hardcover
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