{"product_id":"reliability-of-high-mobility-sige-channel-mosfets-for-future-cmos-applications-2014","title":"Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications","description":"\u003cp\u003e\"Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications\" by Jacopo Franco, Ben Kaczer, Guido Groeseneken is a physics book focused on Devices \u0026amp; Sensors. Best for students, educators, and scientifically curious readers.\u003c\/p\u003e\n\u003cp\u003eThis book explores the reliability of novel (Si)Ge channel quantum well pMOSFET technology. It proposes a physical model to understand the intrinsically superior reliability of the MOS system consisting of a Ge-based channel and a SiO2\/HfO2 dielectric stack.\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Default Title","offer_id":46421957443783,"sku":"1-99-537-000902","price":109.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0736\/9575\/6487\/files\/9789400776623.jpg?v=1776387251","url":"https:\/\/snowflakeskies.com\/products\/reliability-of-high-mobility-sige-channel-mosfets-for-future-cmos-applications-2014","provider":"Snowflake Skies","version":"1.0","type":"link"}