{"product_id":"metal-impurities-in-silicon-and-germanium-based-technologies-origin-characterization-control-and-device-impact-2018","title":"Metal Impurities in Silicon- and Germanium-Based Technologies","description":"\u003cp\u003e\"Metal Impurities in Silicon- and Germanium-Based Technologies\" by Cor Claeys, Eddy Simoen is a physics book focused on Devices \u0026amp; Sensors. Best for students, educators, and scientifically curious readers.\u003c\/p\u003e\n\u003cp\u003eThis book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and\/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices’ performance. Several control and possible gettering approaches are addressed. The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Default Title","offer_id":46421923528903,"sku":"1-99-537-000587","price":199.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0736\/9575\/6487\/files\/9783319939247.jpg?v=1776385296","url":"https:\/\/snowflakeskies.com\/products\/metal-impurities-in-silicon-and-germanium-based-technologies-origin-characterization-control-and-device-impact-2018","provider":"Snowflake Skies","version":"1.0","type":"link"}